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Integrating Metamodel Driven Measurement in the Eclipse IDE
(Departmental Seminar)

By: Fernando Brito e Abreu

Java on the Eclipse IDE is currently one of the most common choices for software development. The existence of a growing number of open-source curated samples in Java, makes it a coveted language for empirical studies on several Software Engineering areas such as software comprehension, reuse, reliability analysis, evolution or cost estimation. In all cases we need complexity metrics that will act as explanatory variables in those studies. Software Engineering researchers have built program analysis tools in Eclipse for several purposes. However, that requires a deep understanding of Eclipse internals, such as the Java Abstract Syntax Tree (AST). We propose a metamodel-driven approach to scaffold the construction of such tools, which circumvents the aforementioned drawback. Its core is the Eclipse Java Metamodel (EJMM) obtained through reverse engineering. This metamodel is instantiated with meta-objects that represent the constructs of a given Java program. We then use the Object Constraint Language (OCL) to analyze programs very easily. To validate its feasibility and scalability, we developed a plug-in to support the MetaModel-Driven Measurement (M2DM) approach that we proposed some years ago. M2DM provides precision, objectiveness and automatic collection. Software metrics are specified as OCL selectors, upon the EJMM and their definition and tuning can be easily performed without changing the plug-in or mastering Eclipse internals. During the presentation I will show the plugin in use throughout the whole lifecycle, from metrics definition to their collection, upon a moderately large software system.


Date: 12 Dec 2013

Location/Event: Departamento de Sistemas Informáticos y Computación, Universitat Politècnica de València (UPV), Spain

url: http://www.upv.es/entidades/DSIC

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